What Flatness Actually Means
A perfectly flat optical surface would have zero deviation from an ideal plane. In reality, every manufactured surface contains small variations. Flatness quantifies the maximum departure of a surface from that ideal plane.
These deviations are typically measured using interferometry, where the test surface is compared against a highly polished reference flat. The resulting interference pattern—known as fringes—provides a visual representation of surface error.
Flatness is usually expressed in fractions or multiples of a wavelength of light. Common reference wavelengths include:
- 632.8 nm (Helium-Neon laser)
- 546 nm (commonly used in ISO specifications)
- 10.6 µm (for infrared applications, such as CO₂ laser optics)
For example, a specification of λ/4 flatness means the surface deviates (peak to valley) by no more than one quarter of the stated wavelength.
Interpreting Interference Fringes
When viewed under an interferometer, deviations from flatness appear as alternating light and dark bands (fringes).
- Straight, evenly spaced fringes → surface is very flat
- Curved or distorted fringes → surface contains deviations

Each fringe typically represents ½ wavelength of optical path difference, allowing surface error to be quantified by fringe count.
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Power and Irregularity
Flatness alone does not fully describe a surface. Optical specifications often break surface accuracy into two components: power and irregularity.
Power
Power refers to the large-scale spherical curvature of a surface—essentially how much the surface bows away from flat.
It is measured by comparing the test surface to a reference surface (flat or spherical for lenses) . The resulting interference pattern often forms concentric rings, known as Newton’s Rings.
- More rings = greater spherical deviation from the reference
- The number of fringes (after automatic tilt removal) corresponds to the magnitude of error
- Each fringe represents ½ wavelength, so:
surface deviation = fringe count × ½λ
Power is considered a low-order error, which can often be compensated for within the user’s application.
Irregularity
Irregularity describes the small-scale, localised deviations from the ideal shape once power has been removed.
In practical terms:
- Power indicates whether the surface is “bowed”
- Irregularity indicates how randomly distorted the surface is
Irregularity is assessed by observing how much the fringes deviate from either a perfectly spherical or flat ideal shape
Total Surface Deviation
Total surface deviation is a combined measure of all surface errors—both low-order (power) and high-order (more random) (irregularity).
It is typically derived from:
- Interferometric surface maps
- Profilometry measurements
This value represents the overall deviation across the full aperture of the optic and provides a useful single-number indicator of surface form error.
Key concept:
Total surface deviation includes all measurable errors and provides a basic overview of surface accuracy.

How Flatness is Specified
Flatness is typically defined using recognised standards such as ISO 10110.
Key points:
- ISO flatness specifications are often referenced at 546 nm
- Specifications may be expressed in terms of power and irregularity
Example ISO notation:
- 3/5(1) → 5 fringes of power and 1 fringe of irregularity (within a specified aperture)
Typical conventions include:
- Units: fringes (waves) or fractions of a wavelength (λ)
- Clear aperture (CA): often specified as a percentage (e.g. 85% CA)
- Clear aperture may be defined as circular or elliptical on square components
- Infrared components are often specified at 10.6 µm, which can make equivalent flatness tolerances appear less stringent numerically
Example specification:
Flatness: 3 fringes over 85% CA @ 632.8 nm

Transmitted Wavefront Error (TWFE)
For transmissive optics, flatness is often extended to Transmitted Wavefront Error (TWFE).
TWFE measures how much the optical wavefront is distorted as it passes through the component, incorporating:
- Surface flatness (both faces)
- Material refractive index
- Material and stress-induced homogeneity
Unlike surface flatness alone, TWFE reflects the optical performance of the entire component, not just its surface geometries.
Reflected Wavefront Error
Reflected error measures the deviation of a perfectly flat wavefront upon reflection from the optic’s surface.
It is determined again using an interferometer, with the analysed result being exactly double the part’s surface error (regardless of refractive index)
Reflected flatness is particularly important for:
- Mirrors
- Beam splitters
It indicates how accurately a surface can reflect light without introducing aberrations.
Why Flatness Matters
Many applications, especially non-imaging applications, are able to function perfectly well with optics specified relatively loosely (for example 2 fringes per inch). However, these can add together within a multi-optic system so care should still be taken.
More demanding applications, such as high-resolution imaging or laser optics, sometimes require what’s known as ‘diffraction limited performance’. Generally, such a condition requires a total transmitted wavefront error (of all optical surfaces combined) to be better than λ/4 (peak to valley), or more precisely the RMS error to be better than λ/14 (the rayleigh criterion).
Given the high refractive index of certain IR materials (Ge, Si, ZnSe), the resultant transmitted wavefront error through an optical component can be significantly higher than total (combined) surface error. However, if diffraction limited performance is a requirement, this is often more than mitigated by the longer design wavelength (eg 10.6 um in the case of a CO2 laser) making λ/14 (RMS) easier to achieve.
A significant trade-off therefore comes into play between price and performance when looking at surface flatness so a clear understanding of the application’s needs can be very important.
Need help selecting the right flatness specification?

Manufacturing Considerations
When producing optics with a flatness specification, several factors must be considered:
- Thickness – thinner components are more difficult to polish to high flatness
- Clear aperture – edge roll-off reduces flatness near the perimeter, hence the need to define a usable aperture
- Material – some materials are inherently more difficult to polish to high flatness
- Other specifications – requirements such as surface finish, parallelism, or coatings can influence achievable flatness
- The required surface quality (scratch-dig) and surface finish (roughness, Rq)
How We Measure Flatness
We utilise a range of metrology equipment to measure and verify flatness, including:
- Low coherence Twyman-Green interferometry (to avoid internal interference between parallel faces)
- 6″ (100 mm) Intellium Z100 horizontal interferometer on a 3 m optical bench, often used to measure transmitted wavefront error or the surface form accuracy of lenses
- 12″ (300 mm) bespoke vertical Fizeau interferometer
- Taylor Hobson PGI 840, to measure the form accuracy of blank (unpolished) lenses and polished aspheres
- Optical flats (under a low pressure sodium light) for rapid in-process checks

Why Choose Crystran
Choosing Crystran as your optical components supplier ensures access to world-class expertise and state-of-the-art manufacturing facilities. Crystran specializes in fabricating high-quality IR and UV materials, including exotic crystals and innovative glasses, all processed under stringent quality controls. With ISO9001:2015 and ISO14001:2015 certifications, Crystran guarantees exceptional quality and environmental responsibility. Their technical sales team offers unparalleled support, ensuring quick, reliable service, whether you need a single optic or a high-volume production run. Crystran’s global reach and competitive pricing make them an ideal choice for optical solutions.
For more details, visit our About Us page.